太赫兹无损检测

太赫兹无损检测(Terahertz nondestructive evaluation),是一種應用太赫波域电磁辐射设备進行檢測、分析及评估的技術。这些装置和技术可用來评估材料、元件或系统的性质,而不会對它們造成损伤。[1]

太赫兹成像是一種新兴和受到重視的无损检测技术。在制药、生物医学、安全、材料科學及航空航天等行业裡,用于电介质(不导通,即绝缘体)材料分析和质量控制[2]。它已經被證實可以有效檢查顏料與被覆的分層[3] 、偵測陶磁複合材料的缺陷 [4],以及斷層掃瞄画作與手稿的物理结构[5][6][7]。使用THz波於非破坏性评估,可進行多层结构体的检查,并能识别异物、夹杂物、脱粘分层、机械冲击破坏、热损伤异常和水或液压流体的侵入[8]

參考文獻

  1. Anastasi, RF; et al. (Chapter title:). Book title: Ultrasonic and advanced methods for nondestructive testing and material characterization. World Scientific Publishing. May 2007: 279–303. ISBN 978-981-270-409-2.
  2. Ospald, Frank; Wissem Zouaghi; Rene Beigang; Matheis Carster. . Optical Engineering. 16 December 2013, 53 [2015-08-24]. doi:10.1117/1.OE.53.3.031208. (原始内容存档于2015-11-19).
  3. Petkie, Douglas; Izaak V. Kemp; Carla Benton; Christopher Boyer; Lindsay Owens; Jason A. Deibel; Christopher D. Stoik; Matthew J. Bohn. (PDF). SPIE Proceedings. 5 October 2009, 7485. doi:10.1117/12.830540.
  4. Jonuscheit, Joachim. (PDF). Fraunhofer Institute for Physical Measurement Techniques IPM. [2015-08-24]. (原始内容 (PDF)存档于2013-06-15).
  5. Walker, Gillian; Bowen, John W.; Matthews, Wendy; Roychowdhury, Soumali; Labaune, Julien; Mourou, Gerard; Menu, Michel; Hodder, Ian; Jackson, J. Bianca. . Optics Express. 27 March 2013, 21 (7): 8126–8134. doi:10.1364/OE.21.008126.
  6. Pastorelli, Gianluca; Trafela, Tanja; Taday, Phillip F.; Portieri, Alessia; Lowe, David; Fukunaga, Kaori; Strlič, Matija. . Analytical and Bioanalytical Chemistry. 25 March 2012, 403 (5): 1405–1414. PMID 22447218. doi:10.1007/s00216-012-5931-9.
  7. Sirro, Sergei; Evgeniy Odlyanitskiy; Alessia Portieri; Phil Taday; Donald D. Arnone; Jean-Paul Guillet; Olga Smolyanskaya. . AIP Conference Proceedings 1335. April 2021, 1866: 012004 [2021-04-24]. doi:10.1088/1742-6596/1866/1/012004.
  8. Hsu, David; Kwang‐Hee Im; Chien‐Ping Chiou; Daniel J. Barnard. . AIP Conference Proceedings 1335. 23 July 2010, 30: 533–540 [2015-08-24]. doi:10.1063/1.3591897. (原始内容存档于2013-04-14).
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