Roos Instruments, Inc.
TypePrivate
IndustrySemiconductor
FoundedSanta Clara, California, U.S. (September 1, 1989 (1989-09-01))
FounderMark Roos
Headquarters
Santa Clara, California
,
U.S.
Number of locations
1 office (2018)
ProductsCASSINI, RI7100A
ServicesTurnkey ATE Test Development
Number of employees
~20 (2022)
Websiteroos.com

Roos Instruments is a company based in Santa Clara, CA that designs and manufactures Automatic Test Equipment (ATE) for the semiconductor industry. Founded in 1989 from a DARPA Small Business Innovation Research (SBIR) grant, the company specializes in mixed-signal, microwave and millimeter wave test of precision consumer and industrial-grade integrated circuits.[1]

Products

RI7100A - Introduced in 1989, the RI7100 offered the industry's first, RF ATE solution designed for test applications up to 24 GHz. Still in use today, the RI7100 tests analog and RF ICs such as low noise amplifiers, mixers, tuners, and transceiver subsystems for consumer products and military applications.

CASSINI - Introduced in 2005, the Cassini ATE platform offers a completely redesigned architecture with modular instruments, a configurable test head, and an integrated device interface environment. Cassini test systems provide the ATE industry's widest measurement range, spanning from DC and high-speed digital to over 110 GHz. The configurable instrument architecture combined with a unique graphical programming environment enables flexible application design and expansion, rapid test development, and high-performance measurement capability.

Standards

SEMI Standards Implemented:

  • SEMI S2-0709 - Environmental, Health, and Safety Guideline for Semiconductor Manufacturing Equipment
  • SEMI E122-0703 - Standard for Tester Equipment Specific Equipment Model (TSEM)
  • SEMI E183 - Specification for Rich Interactive Test Database (RITdb) [2]

CAST Participant[3]

References

  1. ↑ "Roos Instruments Inc - Company Profile and News - Bloomberg Markets". Bloomberg Markets. 2022-09-12. Retrieved 2022-09-12.
  2. ↑ "E18300 - SEMI E183 - Specification for Rich Interactive Test Database – semi.org". Semi.org. 2022-04-01. Retrieved 2020-09-12.
  3. ↑ "SEMI CAST Kick Off Meeting (April 9, 2009)". Semi.org. 2009-04-09. Retrieved 2011-05-04.
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