中子衍射技术

中子衍射技术或者‘弹性的中子散射’是研究晶体学的方法（neutron diffraction; elastic neutron scattering）,是用来确定某个材料的原子结构或磁性结构。这也是弹性散射的一种，离开中子具有入射中子相同或略低的能量。这个技术与X射线衍射类似，其主要差别在于它们不同衍射性质，这两种技术可以互为补充。中子和X射线提供互为补充的信息：X射线适合于表面分析，同步辐射产生的强X射线适合于浅的深度或薄的样品，而穿透深度高的中子适合于块状样品[1]。

An imaging technique known as neutron diffraction, used along with molecular simulations, revealed that an ion channels voltage sensing domain (red, yellow and blue molecule at center) perturbs the two-layered cell membrane that surrounds it (yellow surfaces), causing the membrane to thin slightly.

註釋
  1. Measurement of residual stress in materials using neutrons （页面存档备份，存于）, IAEA, 2003

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